Journal of Semiconductors
EDITORIAL
RESEARCH HIGHLIGHTS
REVIEWS
- Comprehensive, in operando, and correlative investigation of defects and their impact on device performance
- Study of structure-property relationship of semiconductor nanomaterials by off-axis electron holography
- In-situ monitoring of dynamic behavior of catalyst materials and reaction intermediates in semiconductor catalytic processes
- Structural evolution of low-dimensional metal oxide semiconductors under external stress
- Recent progress on advanced transmission electron microscopy characterization for halide perovskite semiconductors